Induced Charge Fluctuations Due to X-Ray Quantum Absorption Point Fluctuations in a Plane-Parallel Semiconductor Detector

V. V. Samedov

Nuclear Physics and Engineering
Âdernaâ fizika i inžiniring

ISSN 2079-5629 (Print)
ISSN 2079-5637 (Online)

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Samedov V.V. Induced Charge Fluctuations Due to X-Ray Quantum Absorption Point Fluctuations in a Plane-Parallel Semiconductor Detector. Nuclear Physics and Engineering. 2023;14(3):248-257. (In Russ.) https://doi.org/10.56304/S2079562922050426

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ISSN 2079-5629 (Print)
ISSN 2079-5637 (Online)

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