Charge Properties of Thorium Implanted in Silicon Oxide

U. N. Kurelchuk; P. V. Borisyuk; A. V. Nikolaev; E. V. Tkalya

Nuclear Physics and Engineering
Âdernaâ fizika i inžiniring

ISSN 2079-5629 (Print)
ISSN 2079-5637 (Online)

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Kurelchuk U.N., Borisyuk P.V., Nikolaev A.V., Tkalya E.V. Charge Properties of Thorium Implanted in Silicon Oxide. Nuclear Physics and Engineering. 2020;11(5):271-277. (In Russ.) https://doi.org/10.1134/S2079562920040090

This work is licensed under a Creative Commons Attribution 4.0 License.

ISSN 2079-5629 (Print)
ISSN 2079-5637 (Online)

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Mikhail N. Strikhanov

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About the Authors

U. N. Kurelchuk
National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)
Russian Federation

Moscow, 115409

P. V. Borisyuk
National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)
Russian Federation

Moscow, 115409

A. V. Nikolaev
National Research Nuclear University MEPhI (Moscow Engineering Physics Institute); Skobeltsyn Institute of Nuclear Physics, Lomonosov Mo scow State University (SINP MSU)
Russian Federation

Moscow, 115409

Moscow, 119991

E. V. Tkalya
National Research Nuclear University MEPhI (Moscow Engineering Physics Institute); Lebedev Physical Institute of the Russian Academy of Sciences; Nuclear Safety Institute of the Russian Academy of Sciences (IBRAE RAN)
Russian Federation

Moscow, 115409

Moscow, 119991

Moscow, 115191

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