Diagnostics of the Transverse Profile of the Ion Beam on X-ray Radiation of the Irradiated Target

Measurements of the transverse profile of the incident beam have a crucial importance for determining the optimal energy deposition of ions in irradiated material and experimental data interpretation in forthcoming FAIR (Facility for Antiproton and Ion Research) experiments on heating of material by intense heavy ion beams. The diagnostic method of transverse distribution of ion beam intensity on a target by detecting of X-ray radiation arising in the target under irradiation of incident ions is proposed. In this work, using the Geant4 numerical code, a full-scale model of the experiment was developed. Numerical simulation of the X-ray diagnostics of the ion beam was performed. Testing of the proposed method and comparison with the experimental results were made using Au+26 ion beam with energy 11.4 MeV/a.m.u. from the UNILAC accelerator at GSI (Germany) incident on 10 μm Cu target. The X-Ray image of the target was formed on a CsI scintillator by a pinhole camera and registered by a CMOS camera with an intensity amplifier.

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