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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">npe</journal-id><journal-title-group><journal-title xml:lang="ru">Ядерная физика и инжиниринг</journal-title><trans-title-group xml:lang="en"><trans-title>Nuclear Physics and Engineering</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2079-5629</issn><issn pub-type="epub">2079-5637</issn><publisher><publisher-name>МИФИ</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.1134/S2079562920040107</article-id><article-id custom-type="elpub" pub-id-type="custom">npe-59</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Материалы и технология для новых источников энергии</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>Materials and Technologies for New Sources of Energy</subject></subj-group></article-categories><title-group><article-title>О возможности применения спектроскопии рассеяния протонов кэвных энергий для анализа поверхности обращенных к плазме элементов непосредственно в термоядерных установках с собственным магнитным полем</article-title><trans-title-group xml:lang="en"><trans-title>On the Possibility of Surface Analysis by keV-Energy Proton Scattering in Magnetic Fusion Devices</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Курнаев</surname><given-names>В. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Kurnaev</surname><given-names>V. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>115409; Каширское ш. 31; Москва</p></bio><bio xml:lang="en"><p>115409; Moscow</p></bio><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Булгадарян</surname><given-names>Д. Г.</given-names></name><name name-style="western" xml:lang="en"><surname>Bulgadaryan</surname><given-names>D. G.</given-names></name></name-alternatives><bio xml:lang="ru"><p>115409; Каширское ш. 31; Москва</p></bio><bio xml:lang="en"><p>115409; Moscow</p></bio><email xlink:type="simple">DGBulgadaryan@mephi.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Синельников</surname><given-names>Д. Н.</given-names></name><name name-style="western" xml:lang="en"><surname>Sinelnikov</surname><given-names>D. N.</given-names></name></name-alternatives><bio xml:lang="ru"><p>115409; Каширское ш. 31; Москва</p></bio><bio xml:lang="en"><p>115409; Moscow</p></bio><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Национальный исследовательский ядерный университет “МИФИ”</institution><country>Россия</country></aff><aff xml:lang="en"><institution>National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2020</year></pub-date><pub-date pub-type="epub"><day>22</day><month>04</month><year>2024</year></pub-date><volume>11</volume><issue>4</issue><fpage>202</fpage><lpage>207</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Курнаев В.А., Булгадарян Д.Г., Синельников Д.Н., 2024</copyright-statement><copyright-year>2024</copyright-year><copyright-holder xml:lang="ru">Курнаев В.А., Булгадарян Д.Г., Синельников Д.Н.</copyright-holder><copyright-holder xml:lang="en">Kurnaev V.A., Bulgadaryan D.G., Sinelnikov D.N.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://npe.elpub.ru/jour/article/view/59">https://npe.elpub.ru/jour/article/view/59</self-uri><abstract><p>   Процессы эрозии и переосаждения обращенных к плазме материалов термоядерных установок (ТЯУ) являются важнейшими факторами, влияющими на конечные параметры получаемой плазмы, ресурс первой стенки и ТЯУ в целом. Метод анализа тонких слоев на поверхности с помощью рассеяния ионов водорода кэвных энергий расширяет функциональные возможности определения скорости эрозии и осаждения слоев с большим атомных номером на подложку из легкого элемента, либо, наоборот, легких слоев на тяжелую подложку, что характерно для современных термоядерных установок. Анализ осаждения и/или эрозии заключается в помещении в плазменную установку специальных маркерных мишеней со слоями материала с малым атомным номером и/или материала с большим атомным номером в те места установки, в которых предполагается исследовать скорость эрозии и/или осаждения, с последующим анализом энергетических спектров, отраженных от экспонированных мишеней ионов водорода с энергиями в килоэлектронвольтном диапазоне. В данной работе приведены оценки применимости данной методики непосредственно в ТЯУ с учетом характерных параметров пристеночной плазмы.</p></abstract><trans-abstract xml:lang="en"><p>   Erosion and redeposition processes of plasma-facing materials in fusion devices are the essential factors affecting near-wall and core plasma parameters and device lifetime. To determine the possibility of in situ analyzing these processes we developed the experimental model of built-in surface analyzer utilizing low-energy proton scattering spectroscopy. We present the results of experimental approbation of the proposed method. The processes of erosion and redeposition of plasma-facing materials in fusion devices are some of the most important factors affecting the plasma parameters and the resource of the first wall. The method of analyzing thin layers on a surface using keV-energy proton scattering expands the functionality of determining the rate of erosion and deposition of layers with a large atomic number on a substrate from a light element, or, conversely, light layers on a heavy substrate, which is typical for modern fusion installations. The analysis of deposition and/or erosion consists in placing special marker targets with layers of material with a low atomic number and/or material with a large atomic number in the places of the installation in which it is supposed to study the rate of erosion and/or deposition, with the subsequent analysis of energy spectra of hydrogen ions reflected from exposed targets with energies in the kiloelectron-volt range. In this paper, estimates of the applicability of this technique directly in a fusion device are given, considering the characteristic parameters of the near-wall plasma.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>взаимодействие плазмы с поверхностью</kwd><kwd>ионное рассеяние</kwd><kwd>анализ поверхности</kwd></kwd-group><kwd-group xml:lang="en"><kwd>plasma-surface interaction</kwd><kwd>ion scattering</kwd><kwd>surface analysis</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">Работа выполнена при поддержке Программы повышения конкурентоспособности НИЯУ МИФИ</funding-statement><funding-statement xml:lang="en">This work was carried out with the support of the Program for increasing the competitiveness of National Research Nuclear University MEPhI</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Philipps V., Wienhold P., Kirschner A., Rubel M. // Vacuum . 2002. 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