<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">npe</journal-id><journal-title-group><journal-title xml:lang="ru">Ядерная физика и инжиниринг</journal-title><trans-title-group xml:lang="en"><trans-title>Nuclear Physics and Engineering</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2079-5629</issn><issn pub-type="epub">2079-5637</issn><publisher><publisher-name>МИФИ</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.56304/S2079562924060186</article-id><article-id custom-type="edn" pub-id-type="custom">ASVDBW</article-id><article-id custom-type="elpub" pub-id-type="custom">npe-403</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Перспективные конструкционные материалы</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>Promising Structural Materials</subject></subj-group></article-categories><title-group><article-title>ИССЛЕДОВАНИЕ ВЛИЯНИЯ ЭЛЕМЕНТНОГО СОСТАВА НА УДЕЛЬНОЕ ЭЛЕКТРОСОПРОТИВЛЕНИЕ ПОКРЫТИЙ TI–B–C, ПОЛУЧЕННЫХ МЕТОДОМ МАГНЕТРОННОГО НАПЫЛЕНИЯ</article-title><trans-title-group xml:lang="en"><trans-title>STUDY OF THE INFLUENCE OF ELEMENTAL COMPOSITION ON SPECIFIC ELECTRICAL RESISTANCE OF TI–B–C COATINGS OBTAINED BY MAGNETRON SPUTTERING METHOD</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Кирюханцев-Корнеев</surname><given-names>Ф. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Kiryukhantsev-Korneev</surname><given-names>Ph. V.</given-names></name></name-alternatives><email xlink:type="simple">kiruhancev-korneev@yandex.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Чертова</surname><given-names>А. Д.</given-names></name><name name-style="western" xml:lang="en"><surname>Chertova</surname><given-names>A. D.</given-names></name></name-alternatives><email xlink:type="simple">kiruhancev-korneev@yandex.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Куц</surname><given-names>В. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Kuts</surname><given-names>V. V.</given-names></name></name-alternatives><email xlink:type="simple">kiruhancev-korneev@yandex.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Погожев</surname><given-names>Ю. С.</given-names></name><name name-style="western" xml:lang="en"><surname>Pogozhev</surname><given-names>Yu. S.</given-names></name></name-alternatives><email xlink:type="simple">kiruhancev-korneev@yandex.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Университет науки и технологий МИСИС</institution><country>Россия</country></aff><aff xml:lang="en"><institution>National University of Science and Technology MISIS</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2024</year></pub-date><pub-date pub-type="epub"><day>25</day><month>12</month><year>2024</year></pub-date><volume>15</volume><issue>6</issue><fpage>547</fpage><lpage>551</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Кирюханцев-Корнеев Ф.В., Чертова А.Д., Куц В.В., Погожев Ю.С., 2024</copyright-statement><copyright-year>2024</copyright-year><copyright-holder xml:lang="ru">Кирюханцев-Корнеев Ф.В., Чертова А.Д., Куц В.В., Погожев Ю.С.</copyright-holder><copyright-holder xml:lang="en">Kiryukhantsev-Korneev P.V., Chertova A.D., Kuts V.V., Pogozhev Y.S.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://npe.elpub.ru/jour/article/view/403">https://npe.elpub.ru/jour/article/view/403</self-uri><abstract><p>Методом магнетронного распыления с использованием гетерофазной мишени TiB2–TiC, при осаждении на наклонную подложку Si (111), получены покрытия Ti–B–C различного состава. Проведены исследования методами оптической эмиссионной спектроскопии, рентгенофазового анализа, растровой электронной микроскопии. Удельное электросопротивление измерено четырехзондовым методом. Покрытия имели плотную малодефектную структуру на основе гексагональной фазы TiB2 и характеризовались равномерным распределением элементов по толщине. Установлено, что при увеличении содержания титана в покрытиях с 27 до 42 ат. % значение удельного электросопротивления снижалось с 314 до 249 мкОм·см.</p></abstract><trans-abstract xml:lang="en"><p>Ti–B–C coatings of various compositions have been obtained by magnetron sputtering using a TiB2–TiC heterophase target and have been deposited on a Si(111) substrate. The studies have been carried out using glow discharge optical emission spectroscopy, X-ray diffraction and scanning electron microscopy. The electrical resistivity has been measured using the four-probe method. The coatings had a dense, low-defect structure based on the hexagonal TiB2 phase and have been characterized by a uniform distribution of elements throughout the thickness. It has been established that the electrical resistivity decreases from 314 to 249 μΩ cm with an increase in the titanium content in coatings from 27 to 42 at %.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>магнетронное распыление</kwd><kwd>покрытия</kwd><kwd>TiB2</kwd><kwd>TiC</kwd><kwd>Ti–B–C</kwd><kwd>удельное электросопротивление</kwd></kwd-group><kwd-group xml:lang="en"><kwd>magnetron sputtering</kwd><kwd>coatings</kwd><kwd>TiB2</kwd><kwd>TiC</kwd><kwd>Ti–B–C</kwd><kwd>electrical resistivity</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">Работа выполнена при финансовой поддержке Российского научного фонда (проект 24-13-00085).</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Levashov E.A. et al. // Surf. Coat. Technol. 1997. V. 92 (1–2). P. 34–41.</mixed-citation><mixed-citation xml:lang="en">Levashov E.A. et al. // Surf. 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